Biometric technology for human identification proceedings of SPIE, 12-13 April 2004 Orlando, Florida, USA
Corporate Authors: | SPIE-International Society for Optical Engineering Conference, SPIE-International Society for Optical Engineering |
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Other Authors: | Jain Anil K. (Editor), Ratha Nalini K. (Editor) |
Format: | Book |
Language: | English |
Published: |
SPIE Optical Engineering Press
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Series: | SPIE Proceedings Series |
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