Semiconductor material and device characterization
| Κύριος συγγραφέας: | |
|---|---|
| Μορφή: | Βιβλίο |
| Γλώσσα: | English |
| Έκδοση: |
Wiley, J.
|
| Έκδοση: | 2nd ed. |
MARC
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|---|---|---|---|
| 001 | 1/9832 | ||
| 010 | |a 0-471-24139-3 | ||
| 035 | |l 10013730 | ||
| 100 | |a 20081104d1998 y0grey010503 ba | ||
| 101 | 0 | |a eng | |
| 200 | 1 | |a Semiconductor material and device characterization |f Dieter K. Schroder | |
| 205 | |a 2nd ed. | ||
| 210 | |a New York |a Chichester |c Wiley, J. |d c1998 | ||
| 215 | |a xxiv, 760 p. |c diagr., fig., tabl. |d 24 cm. | ||
| 300 | |a Πρόγραμμα "ΑΡΧΙΜΗΔΗΣ" | ||
| 320 | |a Includes bibliographical references and index | ||
| 606 | 0 | |a Ημιαγωγοί |x Δοκιμή | |
| 615 | |a ΗΛΕΚΤΡΟΝΙΚΗ | ||
| 676 | |a 621.381 52 | ||
| 700 | 1 | |a Schroder |b Dieter K. |4 070 | |
| 709 | |a Wiley, J. | ||
| 801 | 0 | |a GR |b ΠΑ.Δ.Α. Βιβλιοθήκη Πανεπιστημιούπολης 2 |c 20081104 |g AACR2 | |
| 852 | |a INST |b LIBRARY |e 20081104 |h 621.381 52 SCH |p 000032397 |q 000032397 |t BK |y 23 |z 1 | ||
| 909 | |b 028623 | ||
| 960 | |a ΝΟΕΜΒΡΙΟΣ 2008 | ||
Εγγραφή στο Ευρετήριο Αναζήτησης
| _version_ | 1780545245785620483 |
|---|---|
| author | Schroder Dieter K. |
| author_facet | Schroder Dieter K. |
| author_role | 070 |
| author_sort | Schroder Dieter K. |
| author_variant | s d k sdk |
| building | Campus Library II |
| collection | LIB2 Catalog |
| dewey-full | 621.38152 |
| dewey-hundreds | 600 |
| dewey-ones | 621 |
| dewey-raw | 621.381 52 |
| dewey-search | 621.381 52 |
| dewey-sort | 3621.381 252 |
| dewey-tens | 620 |
| edition | 2nd ed. |
| format | Book |
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|
| id | lib2_1/9832 |
| illustrated | Illustrated |
| institution | University of West Attica |
| isbn | 0-471-24139-3 |
| language | English |
| physical | xxiv, 760 p. diagr., fig., tabl. 24 cm. |
| publishDate | 1998 |
| publisher | Wiley, J. |
| record_format | marc |
| spelling | 20081104d1998 y0grey010503 ba eng Semiconductor material and device characterization Dieter K. Schroder 2nd ed. New York Chichester Wiley, J. c1998 xxiv, 760 p. diagr., fig., tabl. 24 cm. Πρόγραμμα "ΑΡΧΙΜΗΔΗΣ" Includes bibliographical references and index Ημιαγωγοί Δοκιμή ΗΛΕΚΤΡΟΝΙΚΗ 621.381 52 Schroder Dieter K. 070 Wiley, J. GR ΠΑ.Δ.Α. Βιβλιοθήκη Πανεπιστημιούπολης 2 20081104 AACR2 INST LIBRARY 20081104 621.381 52 SCH 000032397 000032397 BK 23 1 |
| spellingShingle | Schroder Dieter K. Semiconductor material and device characterization Ημιαγωγοί Δοκιμή ΗΛΕΚΤΡΟΝΙΚΗ |
| title | Semiconductor material and device characterization |
| title_auth | Semiconductor material and device characterization |
| title_full | Semiconductor material and device characterization Dieter K. Schroder |
| title_fullStr | Semiconductor material and device characterization Dieter K. Schroder |
| title_full_unstemmed | Semiconductor material and device characterization Dieter K. Schroder |
| title_short | Semiconductor material and device characterization |
| topic | Ημιαγωγοί Δοκιμή ΗΛΕΚΤΡΟΝΙΚΗ |
| topic_facet | Ημιαγωγοί Δοκιμή |