Biometric technology for human identification proceedings of SPIE, 12-13 April 2004 Orlando, Florida, USA

Bibliographic Details
Corporate Authors: SPIE-International Society for Optical Engineering Conference, SPIE-International Society for Optical Engineering
Other Authors: Jain Anil K. (Editor), Ratha Nalini K. (Editor)
Format: Book
Language:English
Published: SPIE Optical Engineering Press
Series:SPIE Proceedings Series