Biometric technology for human identification proceedings of SPIE, 12-13 April 2004 Orlando, Florida, USA
| Συλλογικό Έργο: | , |
|---|---|
| Άλλοι συγγραφείς: | , |
| Μορφή: | Βιβλίο |
| Γλώσσα: | English |
| Έκδοση: |
SPIE Optical Engineering Press
|
| Σειρά: | SPIE Proceedings Series |
MARC
| LEADER | 00000cam a22000001 4500 | ||
|---|---|---|---|
| 001 | 1/9612 | ||
| 010 | |a 0-8194-5327-7 | ||
| 011 | |a 0277-786Χ | ||
| 035 | |l 10013655 | ||
| 100 | |a 20080930d2004 y0grey010503 ba | ||
| 101 | 0 | |a eng | |
| 200 | 1 | |a Biometric technology for human identification |e proceedings of SPIE, 12-13 April 2004 Orlando, Florida, USA |f Anil K. Jain, Nalini K. Ratha chairs/editors |g sponsored and published by SPIE-The International Society for Optical Engineering | |
| 210 | |a Bellingham, Washington |c SPIE |d c2004 | ||
| 215 | |a xi, 598 p. |c fig., tabl. |d 28 cm. | ||
| 225 | 2 | |a SPIE Proceedings Series |v 5404 | |
| 300 | |a Πρόγραμμα "ΑΡΧΙΜΗΔΗΣ" | ||
| 320 | |a Includes bibliographical references and index | ||
| 410 | 1 | |t SPIE Proceedings Series |v 5404 | |
| 606 | 0 | |a Αναγνώριση προτύπων |x Συνέδρια | |
| 606 | 0 | |a Βιομετρία |x Συνέδρια | |
| 606 | 0 | |a Σύστημα ταύτισης |x Συνέδρια | |
| 606 | 0 | |a Δακτυλικά αποτυπώματα |x Συνέδρια | |
| 615 | |a ΕΠΙΣΤΗΜΗ ΥΠΟΛΟΓΙΣΤΗ (SOFTWARE) | ||
| 676 | |a 006.42 | ||
| 702 | 1 | |a Jain |b Anil K. |4 340 | |
| 702 | 1 | |a Ratha |b Nalini K. |4 340 | |
| 709 | |a SPIE Optical Engineering Press | ||
| 710 | 1 | 2 | |a SPIE-International Society for Optical Engineering Conference |f (12-13 April 2004: |e Orlando, Florida, USA) |
| 711 | 0 | 2 | |a SPIE-International Society for Optical Engineering |
| 801 | 0 | |a GR |b ΠΑ.Δ.Α. Βιβλιοθήκη Πανεπιστημιούπολης 2 |c 20080930 |g AACR2 | |
| 852 | |a INST |b LIBRARY |e 20080930 |h 006.42 BIO |p 000030637 |q 000030637 |t BK |y 23 |z 1 | ||
| 909 | |b 028480 | ||
| 960 | |a ΣΕΠΤΕΜΒΡΙΟΣ 2008 | ||
Εγγραφή στο Ευρετήριο Αναζήτησης
| _version_ | 1780545245557030914 |
|---|---|
| author2 | Jain Anil K. Ratha Nalini K. |
| author2_role | 340 340 |
| author2_variant | j a k jak r n k rnk |
| author_corporate | SPIE-International Society for Optical Engineering Conference SPIE-International Society for Optical Engineering |
| author_corporate_role | |
| author_facet | Jain Anil K. Ratha Nalini K. SPIE-International Society for Optical Engineering Conference SPIE-International Society for Optical Engineering |
| author_sort | SPIE-International Society for Optical Engineering Conference |
| building | Campus Library II |
| collection | LIB2 Catalog |
| dewey-full | 006.42 |
| dewey-hundreds | 000 |
| dewey-ones | 006 |
| dewey-raw | 006.42 |
| dewey-search | 006.42 |
| dewey-sort | 16.42 |
| dewey-tens | 000 |
| format | Book |
| fullrecord | {"leader":"01687cam a22003611 4500","fields":[{"001":"1/9612"},{"010":{"subfields":[{"a":"0-8194-5327-7"}],"ind1":" ","ind2":" "}},{"011":{"subfields":[{"a":"0277-786\u03a7"}],"ind1":" ","ind2":" "}},{"035":{"subfields":[{"l":"10013655"}],"ind1":" ","ind2":" "}},{"100":{"subfields":[{"a":"20080930d2004 y0grey010503 ba"}],"ind1":" ","ind2":" "}},{"101":{"subfields":[{"a":"eng"}],"ind1":"0","ind2":" "}},{"200":{"subfields":[{"a":"Biometric technology for human identification"},{"e":"proceedings of SPIE, 12-13 April 2004 Orlando, Florida, USA"},{"f":"Anil K. Jain, Nalini K. Ratha chairs/editors"},{"g":"sponsored and published by SPIE-The International Society for Optical Engineering"}],"ind1":"1","ind2":" "}},{"210":{"subfields":[{"a":"Bellingham, Washington"},{"c":"SPIE"},{"d":"c2004"}],"ind1":" ","ind2":" "}},{"215":{"subfields":[{"a":"xi, 598 p."},{"c":"fig., tabl."},{"d":"28 cm."}],"ind1":" ","ind2":" "}},{"225":{"subfields":[{"a":"SPIE Proceedings Series"},{"v":"5404"}],"ind1":"2","ind2":" "}},{"300":{"subfields":[{"a":"\u03a0\u03c1\u03cc\u03b3\u03c1\u03b1\u03bc\u03bc\u03b1 \"\u0391\u03a1\u03a7\u0399\u039c\u0397\u0394\u0397\u03a3\""}],"ind1":" ","ind2":" "}},{"320":{"subfields":[{"a":"Includes bibliographical references and index"}],"ind1":" ","ind2":" "}},{"410":{"subfields":[{"t":"SPIE Proceedings Series"},{"v":"5404"}],"ind1":" ","ind2":"1"}},{"606":{"subfields":[{"a":"\u0391\u03bd\u03b1\u03b3\u03bd\u03ce\u03c1\u03b9\u03c3\u03b7 \u03c0\u03c1\u03bf\u03c4\u03cd\u03c0\u03c9\u03bd"},{"x":"\u03a3\u03c5\u03bd\u03ad\u03b4\u03c1\u03b9\u03b1"}],"ind1":"0","ind2":" "}},{"606":{"subfields":[{"a":"\u0392\u03b9\u03bf\u03bc\u03b5\u03c4\u03c1\u03af\u03b1"},{"x":"\u03a3\u03c5\u03bd\u03ad\u03b4\u03c1\u03b9\u03b1"}],"ind1":"0","ind2":" "}},{"606":{"subfields":[{"a":"\u03a3\u03cd\u03c3\u03c4\u03b7\u03bc\u03b1 \u03c4\u03b1\u03cd\u03c4\u03b9\u03c3\u03b7\u03c2"},{"x":"\u03a3\u03c5\u03bd\u03ad\u03b4\u03c1\u03b9\u03b1"}],"ind1":"0","ind2":" "}},{"606":{"subfields":[{"a":"\u0394\u03b1\u03ba\u03c4\u03c5\u03bb\u03b9\u03ba\u03ac \u03b1\u03c0\u03bf\u03c4\u03c5\u03c0\u03ce\u03bc\u03b1\u03c4\u03b1"},{"x":"\u03a3\u03c5\u03bd\u03ad\u03b4\u03c1\u03b9\u03b1"}],"ind1":"0","ind2":" "}},{"615":{"subfields":[{"a":"\u0395\u03a0\u0399\u03a3\u03a4\u0397\u039c\u0397 \u03a5\u03a0\u039f\u039b\u039f\u0393\u0399\u03a3\u03a4\u0397 (SOFTWARE)"}],"ind1":" ","ind2":" "}},{"676":{"subfields":[{"a":"006.42"}],"ind1":" ","ind2":" "}},{"702":{"subfields":[{"a":"Jain"},{"b":"Anil K."},{"4":"340"}],"ind1":" ","ind2":"1"}},{"702":{"subfields":[{"a":"Ratha"},{"b":"Nalini K."},{"4":"340"}],"ind1":" ","ind2":"1"}},{"709":{"subfields":[{"a":"SPIE Optical Engineering Press"}],"ind1":" ","ind2":" "}},{"710":{"subfields":[{"a":"SPIE-International Society for Optical Engineering Conference"},{"f":"(12-13 April 2004:"},{"e":"Orlando, Florida, USA)"}],"ind1":"1","ind2":"2"}},{"711":{"subfields":[{"a":"SPIE-International Society for Optical Engineering"}],"ind1":"0","ind2":"2"}},{"801":{"subfields":[{"a":"GR"},{"b":"\u03a0\u0391.\u0394.\u0391. \u0392\u03b9\u03b2\u03bb\u03b9\u03bf\u03b8\u03ae\u03ba\u03b7 \u03a0\u03b1\u03bd\u03b5\u03c0\u03b9\u03c3\u03c4\u03b7\u03bc\u03b9\u03bf\u03cd\u03c0\u03bf\u03bb\u03b7\u03c2 2"},{"c":"20080930"},{"g":"AACR2"}],"ind1":" ","ind2":"0"}},{"852":{"subfields":[{"a":"INST"},{"b":"LIBRARY"},{"e":"20080930"},{"h":"006.42 BIO"},{"p":"000030637"},{"q":"000030637"},{"t":"BK"},{"y":"23"},{"z":"1"}],"ind1":" ","ind2":" "}},{"909":{"subfields":[{"b":"028480"}],"ind1":" ","ind2":" "}},{"960":{"subfields":[{"a":"\u03a3\u0395\u03a0\u03a4\u0395\u039c\u0392\u03a1\u0399\u039f\u03a3 2008"}],"ind1":" ","ind2":" "}}]}
|
| id | lib2_1/9612 |
| illustrated | Illustrated |
| institution | University of West Attica |
| isbn | 0-8194-5327-7 |
| issn | 0277-786Χ |
| language | English |
| physical | xi, 598 p. fig., tabl. 28 cm. |
| publishDate | 2004 |
| publisher | SPIE Optical Engineering Press |
| record_format | marc |
| series2 | SPIE Proceedings Series |
| spelling | 20080930d2004 y0grey010503 ba eng Biometric technology for human identification proceedings of SPIE, 12-13 April 2004 Orlando, Florida, USA Anil K. Jain, Nalini K. Ratha chairs/editors sponsored and published by SPIE-The International Society for Optical Engineering Bellingham, Washington SPIE c2004 xi, 598 p. fig., tabl. 28 cm. SPIE Proceedings Series 5404 Πρόγραμμα "ΑΡΧΙΜΗΔΗΣ" Includes bibliographical references and index Αναγνώριση προτύπων Συνέδρια Βιομετρία Συνέδρια Σύστημα ταύτισης Συνέδρια Δακτυλικά αποτυπώματα Συνέδρια ΕΠΙΣΤΗΜΗ ΥΠΟΛΟΓΙΣΤΗ (SOFTWARE) 006.42 Jain Anil K. 340 Ratha Nalini K. 340 SPIE Optical Engineering Press SPIE-International Society for Optical Engineering Conference (12-13 April 2004: Orlando, Florida, USA) SPIE-International Society for Optical Engineering GR ΠΑ.Δ.Α. Βιβλιοθήκη Πανεπιστημιούπολης 2 20080930 AACR2 INST LIBRARY 20080930 006.42 BIO 000030637 000030637 BK 23 1 |
| spellingShingle | Biometric technology for human identification proceedings of SPIE, 12-13 April 2004 Orlando, Florida, USA Αναγνώριση προτύπων Συνέδρια Βιομετρία Συνέδρια Σύστημα ταύτισης Συνέδρια Δακτυλικά αποτυπώματα Συνέδρια ΕΠΙΣΤΗΜΗ ΥΠΟΛΟΓΙΣΤΗ (SOFTWARE) |
| title | Biometric technology for human identification proceedings of SPIE, 12-13 April 2004 Orlando, Florida, USA |
| title_auth | Biometric technology for human identification proceedings of SPIE, 12-13 April 2004 Orlando, Florida, USA |
| title_full | Biometric technology for human identification proceedings of SPIE, 12-13 April 2004 Orlando, Florida, USA Anil K. Jain, Nalini K. Ratha chairs/editors sponsored and published by SPIE-The International Society for Optical Engineering |
| title_fullStr | Biometric technology for human identification proceedings of SPIE, 12-13 April 2004 Orlando, Florida, USA Anil K. Jain, Nalini K. Ratha chairs/editors sponsored and published by SPIE-The International Society for Optical Engineering |
| title_full_unstemmed | Biometric technology for human identification proceedings of SPIE, 12-13 April 2004 Orlando, Florida, USA Anil K. Jain, Nalini K. Ratha chairs/editors sponsored and published by SPIE-The International Society for Optical Engineering |
| title_short | Biometric technology for human identification |
| title_sub | proceedings of SPIE, 12-13 April 2004 Orlando, Florida, USA |
| topic | Αναγνώριση προτύπων Συνέδρια Βιομετρία Συνέδρια Σύστημα ταύτισης Συνέδρια Δακτυλικά αποτυπώματα Συνέδρια ΕΠΙΣΤΗΜΗ ΥΠΟΛΟΓΙΣΤΗ (SOFTWARE) |
| topic_facet | Αναγνώριση προτύπων Συνέδρια Βιομετρία Συνέδρια Σύστημα ταύτισης Συνέδρια Δακτυλικά αποτυπώματα Συνέδρια |