SPIE-International Society for Optical Engineering Conference, SPIE-International Society for Optical Engineering, Jain Anil K., & Ratha Nalini K. (2004). Biometric technology for human identification: Proceedings of SPIE, 12-13 April 2004 Orlando, Florida, USA. SPIE Optical Engineering Press.
Παραπομπή σε μορφή Chicago (17η εκδ.)SPIE-International Society for Optical Engineering Conference, SPIE-International Society for Optical Engineering, Jain Anil K., και Ratha Nalini K. Biometric Technology for Human Identification: Proceedings of SPIE, 12-13 April 2004 Orlando, Florida, USA. SPIE Optical Engineering Press, 2004.
Παραπομπή σε μορφή MLA (8th εκδ.)SPIE-International Society for Optical Engineering Conference, et al. Biometric Technology for Human Identification: Proceedings of SPIE, 12-13 April 2004 Orlando, Florida, USA. SPIE Optical Engineering Press, 2004.