Sensing, processing, networking IMTC proceedings, Hotel Chateau - Ottawa, Canada - May 19-21, 1997
Συλλογικό Έργο: | , |
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Μορφή: | Βιβλίο |
Γλώσσα: | English |
Έκδοση: |
IEEE Press
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MARC
LEADER | 00000nam a2200000 i 4500 | ||
---|---|---|---|
001 | 1/8654 | ||
010 | |a 0-7803-3747-6 | ||
035 | |l 10006804 | ||
100 | |a 19990609d1997 0grey0105 ba | ||
101 | 0 | |a eng | |
200 | 1 | |a Sensing, processing, networking |e IMTC proceedings, Hotel Chateau - Ottawa, Canada - May 19-21, 1997 |f sponsors : IEEE Instrumentation & Measurement Society, IEEE Ottawa Section | |
210 | |a New Jersey |c The Institute of Electrical and Electronics Engineers |d 1997 | ||
215 | |a 2 v. |c fig., tabl. |d 28 cm. | ||
320 | |a Includes bibliographical references and index | ||
601 | 0 | 2 | |a IEEE |x Proceedings |
606 | 0 | |a Μετρήσεις |x Συνέδρια | |
606 | 0 | |a Επεξεργασία εικόνας |x Ψηφιακές τεχνικές |x Συνέδρια | |
606 | 0 | |a Επεξεργασία σήματος |x Ψηφιακές τεχνικές |x Συνέδρια | |
606 | 0 | |a Αισθητήρες |x Συνέδρια | |
606 | 0 | |a Όργανα μετρήσεων |x Συνέδρια | |
676 | |a 621.3 | ||
709 | |a IEEE Press | ||
710 | 1 | 2 | |a IEEE Instrumentation & Measurement Technology Conference |d (14th: |f May 19-21, 1997: |e Ottawa) |
711 | 0 | 2 | |a IEEE |
801 | 0 | |a GR |b ΠΑ.Δ.Α. - Βιβλιοθήκη Πανεπιστημιούπολης 2 |g AACR2 | |
852 | |a INST |b LIBRARY |e 19990609 |h 621.3 IEEE |p 000020277 |q 000020277 |t BK |v v.2: |y 23 |z 1 | ||
852 | |a INST |b LIBRARY |e 19990609 |h 621.3 IEEE |p 000020279 |q 000020279 |t BK |v v.1: |y 23 |z 1 | ||
853 | |a INST |b LIBRARY |h 621.3 IEEE |l v.1; v.2 | ||
909 | |b 016718 (v.1, c.1) | ||
909 | |b 016719 (v.2, c.1) | ||
960 | |a ΙΟΥΝΙΟΣ 1999 |
Εγγραφή στο Ευρετήριο Αναζήτησης
_version_ | 1780545245353607169 |
---|---|
author_corporate | IEEE Instrumentation & Measurement Technology Conference IEEE |
author_corporate_role | |
author_facet | IEEE Instrumentation & Measurement Technology Conference IEEE |
author_sort | IEEE Instrumentation & Measurement Technology Conference |
building | Campus Library II |
collection | LIB2 Catalog |
dewey-full | 621.3 |
dewey-hundreds | 600 |
dewey-ones | 621 |
dewey-raw | 621.3 |
dewey-search | 621.3 |
dewey-sort | 3621.3 |
dewey-tens | 620 |
format | Book |
fullrecord | {"leader":"01598nam a2200337 i 4500","fields":[{"001":"1/8654"},{"010":{"subfields":[{"a":"0-7803-3747-6"}],"ind1":" ","ind2":" "}},{"035":{"subfields":[{"l":"10006804"}],"ind1":" ","ind2":" "}},{"100":{"subfields":[{"a":"19990609d1997 0grey0105 ba"}],"ind1":" ","ind2":" "}},{"101":{"subfields":[{"a":"eng"}],"ind1":"0","ind2":" "}},{"200":{"subfields":[{"a":"Sensing, processing, networking"},{"e":"IMTC proceedings, Hotel Chateau - Ottawa, Canada - May 19-21, 1997"},{"f":"sponsors : IEEE Instrumentation & Measurement Society, IEEE Ottawa Section"}],"ind1":"1","ind2":" "}},{"210":{"subfields":[{"a":"New Jersey"},{"c":"The Institute of Electrical and Electronics Engineers"},{"d":"1997"}],"ind1":" ","ind2":" "}},{"215":{"subfields":[{"a":"2 v."},{"c":"fig., tabl."},{"d":"28 cm."}],"ind1":" ","ind2":" "}},{"320":{"subfields":[{"a":"Includes bibliographical references and index"}],"ind1":" ","ind2":" "}},{"601":{"subfields":[{"a":"IEEE"},{"x":"Proceedings"}],"ind1":"0","ind2":"2"}},{"606":{"subfields":[{"a":"\u039c\u03b5\u03c4\u03c1\u03ae\u03c3\u03b5\u03b9\u03c2"},{"x":"\u03a3\u03c5\u03bd\u03ad\u03b4\u03c1\u03b9\u03b1 "}],"ind1":"0","ind2":" "}},{"606":{"subfields":[{"a":"\u0395\u03c0\u03b5\u03be\u03b5\u03c1\u03b3\u03b1\u03c3\u03af\u03b1 \u03b5\u03b9\u03ba\u03cc\u03bd\u03b1\u03c2"},{"x":"\u03a8\u03b7\u03c6\u03b9\u03b1\u03ba\u03ad\u03c2 \u03c4\u03b5\u03c7\u03bd\u03b9\u03ba\u03ad\u03c2"},{"x":"\u03a3\u03c5\u03bd\u03ad\u03b4\u03c1\u03b9\u03b1"}],"ind1":"0","ind2":" "}},{"606":{"subfields":[{"a":"\u0395\u03c0\u03b5\u03be\u03b5\u03c1\u03b3\u03b1\u03c3\u03af\u03b1 \u03c3\u03ae\u03bc\u03b1\u03c4\u03bf\u03c2"},{"x":"\u03a8\u03b7\u03c6\u03b9\u03b1\u03ba\u03ad\u03c2 \u03c4\u03b5\u03c7\u03bd\u03b9\u03ba\u03ad\u03c2"},{"x":"\u03a3\u03c5\u03bd\u03ad\u03b4\u03c1\u03b9\u03b1"}],"ind1":"0","ind2":" "}},{"606":{"subfields":[{"a":"\u0391\u03b9\u03c3\u03b8\u03b7\u03c4\u03ae\u03c1\u03b5\u03c2"},{"x":"\u03a3\u03c5\u03bd\u03ad\u03b4\u03c1\u03b9\u03b1"}],"ind1":"0","ind2":" "}},{"606":{"subfields":[{"a":"\u038c\u03c1\u03b3\u03b1\u03bd\u03b1 \u03bc\u03b5\u03c4\u03c1\u03ae\u03c3\u03b5\u03c9\u03bd "},{"x":"\u03a3\u03c5\u03bd\u03ad\u03b4\u03c1\u03b9\u03b1"}],"ind1":"0","ind2":" "}},{"676":{"subfields":[{"a":"621.3"}],"ind1":" ","ind2":" "}},{"709":{"subfields":[{"a":"IEEE Press"}],"ind1":" ","ind2":" "}},{"710":{"subfields":[{"a":"IEEE Instrumentation & Measurement Technology Conference"},{"d":"(14th:"},{"f":"May 19-21, 1997:"},{"e":"Ottawa)"}],"ind1":"1","ind2":"2"}},{"711":{"subfields":[{"a":"IEEE"}],"ind1":"0","ind2":"2"}},{"801":{"subfields":[{"a":"GR"},{"b":"\u03a0\u0391.\u0394.\u0391. - \u0392\u03b9\u03b2\u03bb\u03b9\u03bf\u03b8\u03ae\u03ba\u03b7 \u03a0\u03b1\u03bd\u03b5\u03c0\u03b9\u03c3\u03c4\u03b7\u03bc\u03b9\u03bf\u03cd\u03c0\u03bf\u03bb\u03b7\u03c2 2"},{"g":"AACR2"}],"ind1":" ","ind2":"0"}},{"852":{"subfields":[{"a":"INST"},{"b":"LIBRARY"},{"e":"19990609"},{"h":"621.3 IEEE"},{"p":"000020277"},{"q":"000020277"},{"t":"BK"},{"v":"v.2:"},{"y":"23"},{"z":"1"}],"ind1":" ","ind2":" "}},{"852":{"subfields":[{"a":"INST"},{"b":"LIBRARY"},{"e":"19990609"},{"h":"621.3 IEEE"},{"p":"000020279"},{"q":"000020279"},{"t":"BK"},{"v":"v.1:"},{"y":"23"},{"z":"1"}],"ind1":" ","ind2":" "}},{"853":{"subfields":[{"a":"INST"},{"b":"LIBRARY"},{"h":"621.3 IEEE"},{"l":"v.1; v.2"}],"ind1":" ","ind2":" "}},{"909":{"subfields":[{"b":"016718 (v.1, c.1)"}],"ind1":" ","ind2":" "}},{"909":{"subfields":[{"b":"016719 (v.2, c.1)"}],"ind1":" ","ind2":" "}},{"960":{"subfields":[{"a":"\u0399\u039f\u03a5\u039d\u0399\u039f\u03a3 1999"}],"ind1":" ","ind2":" "}}]}
|
id | lib2_1/8654 |
illustrated | Illustrated |
institution | University of West Attica |
isbn | 0-7803-3747-6 |
language | English |
physical | 2 v. fig., tabl. 28 cm. |
publishDate | 1997 |
publisher | IEEE Press |
record_format | marc |
spelling | 19990609d1997 0grey0105 ba eng Sensing, processing, networking IMTC proceedings, Hotel Chateau - Ottawa, Canada - May 19-21, 1997 sponsors : IEEE Instrumentation & Measurement Society, IEEE Ottawa Section New Jersey The Institute of Electrical and Electronics Engineers 1997 2 v. fig., tabl. 28 cm. Includes bibliographical references and index IEEE Proceedings Μετρήσεις Συνέδρια Επεξεργασία εικόνας Ψηφιακές τεχνικές Συνέδρια Επεξεργασία σήματος Ψηφιακές τεχνικές Συνέδρια Αισθητήρες Συνέδρια Όργανα μετρήσεων Συνέδρια 621.3 IEEE Press IEEE Instrumentation & Measurement Technology Conference (14th: May 19-21, 1997: Ottawa) IEEE GR ΠΑ.Δ.Α. - Βιβλιοθήκη Πανεπιστημιούπολης 2 AACR2 INST LIBRARY 19990609 621.3 IEEE 000020277 000020277 BK v.2: 23 1 INST LIBRARY 19990609 621.3 IEEE 000020279 000020279 BK v.1: 23 1 INST LIBRARY 621.3 IEEE v.1; v.2 |
spellingShingle | Sensing, processing, networking IMTC proceedings, Hotel Chateau - Ottawa, Canada - May 19-21, 1997 IEEE Proceedings Μετρήσεις Συνέδρια Επεξεργασία εικόνας Ψηφιακές τεχνικές Συνέδρια Επεξεργασία σήματος Ψηφιακές τεχνικές Συνέδρια Αισθητήρες Συνέδρια Όργανα μετρήσεων Συνέδρια |
title | Sensing, processing, networking IMTC proceedings, Hotel Chateau - Ottawa, Canada - May 19-21, 1997 |
title_auth | Sensing, processing, networking IMTC proceedings, Hotel Chateau - Ottawa, Canada - May 19-21, 1997 |
title_full | Sensing, processing, networking IMTC proceedings, Hotel Chateau - Ottawa, Canada - May 19-21, 1997 sponsors : IEEE Instrumentation & Measurement Society, IEEE Ottawa Section |
title_fullStr | Sensing, processing, networking IMTC proceedings, Hotel Chateau - Ottawa, Canada - May 19-21, 1997 sponsors : IEEE Instrumentation & Measurement Society, IEEE Ottawa Section |
title_full_unstemmed | Sensing, processing, networking IMTC proceedings, Hotel Chateau - Ottawa, Canada - May 19-21, 1997 sponsors : IEEE Instrumentation & Measurement Society, IEEE Ottawa Section |
title_short | Sensing, processing, networking |
title_sub | IMTC proceedings, Hotel Chateau - Ottawa, Canada - May 19-21, 1997 |
topic | IEEE Proceedings Μετρήσεις Συνέδρια Επεξεργασία εικόνας Ψηφιακές τεχνικές Συνέδρια Επεξεργασία σήματος Ψηφιακές τεχνικές Συνέδρια Αισθητήρες Συνέδρια Όργανα μετρήσεων Συνέδρια |
topic_facet | IEEE Proceedings Μετρήσεις Συνέδρια Επεξεργασία εικόνας Ψηφιακές τεχνικές Συνέδρια Επεξεργασία σήματος Ψηφιακές τεχνικές Συνέδρια Αισθητήρες Συνέδρια Όργανα μετρήσεων Συνέδρια |