Semiconductor measurements and instrumentation
Κύριοι συγγραφείς: | , |
---|---|
Μορφή: | Βιβλίο |
Γλώσσα: | English |
Έκδοση: |
McGraw-Hill
|
Έκδοση: | 2nd ed. |
MARC
LEADER | 00000nam a2200000 i 4500 | ||
---|---|---|---|
001 | 1/6666 | ||
010 | |a 0-07-057697-1 | ||
035 | |l 10012459 | ||
100 | |a 20040204d1998 0grey0105 ba | ||
101 | 0 | |a eng | |
200 | 1 | |a Semiconductor measurements and instrumentation |f W.R. Runyan and T.J. Shaffner | |
205 | |a 2nd ed. | ||
210 | |a New York |c McGraw-Hill |d c1998 | ||
215 | |a x, 454 p. |c fig., tabl. |d 24 cm. | ||
320 | |a Includes bibliographical references and index | ||
606 | 0 | |a Ημιαγωγοί | |
606 | 0 | |a Φυσικές μετρήσεις | |
615 | |a ΗΛΕΚΤΡΟΝΙΚΗ | ||
676 | |a 621.381 52 | ||
700 | 1 | |a Runyan |b W. R. | |
701 | 1 | |a Shaffner |b T. J. | |
709 | |a McGraw-Hill | ||
801 | 0 | |a GR |b ΠΑ.Δ.Α. - Βιβλιοθήκη Πανεπιστημιούπολης 2 |g AACR2 | |
852 | |a INST |b LIBRARY |e 20040204 |h 621.381 52 RUN |p 000028736 |q 000028736 |t BK |y 0 |z 2 | ||
852 | |a INST |b LIBRARY |e 20040204 |h 621.381 52 RUN |p 000028739 |q 000028739 |t BK |y 23 |z 1 | ||
909 | |b 026310 | ||
909 | |b 026311 (c.2) | ||
960 | |a ΦΕΒΡΟΥΑΡΙΟΣ 2004 |
Εγγραφή στο Ευρετήριο Αναζήτησης
_version_ | 1780545243694759936 |
---|---|
author | Runyan W. R. Shaffner T. J. |
author_facet | Runyan W. R. Shaffner T. J. |
author_role | |
author_sort | Runyan W. R. |
author_variant | r w r rwr s t j stj |
building | Campus Library II |
collection | LIB2 Catalog |
dewey-full | 621.38152 |
dewey-hundreds | 600 |
dewey-ones | 621 |
dewey-raw | 621.381 52 |
dewey-search | 621.381 52 |
dewey-sort | 3621.381 252 |
dewey-tens | 620 |
edition | 2nd ed. |
format | Book |
fullrecord | {"leader":"01060nam a2200301 i 4500","fields":[{"001":"1/6666"},{"010":{"subfields":[{"a":"0-07-057697-1"}],"ind1":" ","ind2":" "}},{"035":{"subfields":[{"l":"10012459"}],"ind1":" ","ind2":" "}},{"100":{"subfields":[{"a":"20040204d1998 0grey0105 ba"}],"ind1":" ","ind2":" "}},{"101":{"subfields":[{"a":"eng"}],"ind1":"0","ind2":" "}},{"200":{"subfields":[{"a":"Semiconductor measurements and instrumentation"},{"f":"W.R. Runyan and T.J. Shaffner"}],"ind1":"1","ind2":" "}},{"205":{"subfields":[{"a":"2nd ed."}],"ind1":" ","ind2":" "}},{"210":{"subfields":[{"a":"New York"},{"c":"McGraw-Hill"},{"d":"c1998"}],"ind1":" ","ind2":" "}},{"215":{"subfields":[{"a":"x, 454 p."},{"c":"fig., tabl."},{"d":"24 cm."}],"ind1":" ","ind2":" "}},{"320":{"subfields":[{"a":"Includes bibliographical references and index"}],"ind1":" ","ind2":" "}},{"606":{"subfields":[{"a":"\u0397\u03bc\u03b9\u03b1\u03b3\u03c9\u03b3\u03bf\u03af"}],"ind1":"0","ind2":" "}},{"606":{"subfields":[{"a":"\u03a6\u03c5\u03c3\u03b9\u03ba\u03ad\u03c2 \u03bc\u03b5\u03c4\u03c1\u03ae\u03c3\u03b5\u03b9\u03c2"}],"ind1":"0","ind2":" "}},{"615":{"subfields":[{"a":"\u0397\u039b\u0395\u039a\u03a4\u03a1\u039f\u039d\u0399\u039a\u0397"}],"ind1":" ","ind2":" "}},{"676":{"subfields":[{"a":"621.381 52"}],"ind1":" ","ind2":" "}},{"700":{"subfields":[{"a":"Runyan"},{"b":"W. R."}],"ind1":" ","ind2":"1"}},{"701":{"subfields":[{"a":"Shaffner"},{"b":"T. J."}],"ind1":" ","ind2":"1"}},{"709":{"subfields":[{"a":"McGraw-Hill"}],"ind1":" ","ind2":" "}},{"801":{"subfields":[{"a":"GR"},{"b":"\u03a0\u0391.\u0394.\u0391. - \u0392\u03b9\u03b2\u03bb\u03b9\u03bf\u03b8\u03ae\u03ba\u03b7 \u03a0\u03b1\u03bd\u03b5\u03c0\u03b9\u03c3\u03c4\u03b7\u03bc\u03b9\u03bf\u03cd\u03c0\u03bf\u03bb\u03b7\u03c2 2"},{"g":"AACR2"}],"ind1":" ","ind2":"0"}},{"852":{"subfields":[{"a":"INST"},{"b":"LIBRARY"},{"e":"20040204"},{"h":"621.381 52 RUN"},{"p":"000028736"},{"q":"000028736"},{"t":"BK"},{"y":"0"},{"z":"2"}],"ind1":" ","ind2":" "}},{"852":{"subfields":[{"a":"INST"},{"b":"LIBRARY"},{"e":"20040204"},{"h":"621.381 52 RUN"},{"p":"000028739"},{"q":"000028739"},{"t":"BK"},{"y":"23"},{"z":"1"}],"ind1":" ","ind2":" "}},{"909":{"subfields":[{"b":"026310"}],"ind1":" ","ind2":" "}},{"909":{"subfields":[{"b":"026311 (c.2)"}],"ind1":" ","ind2":" "}},{"960":{"subfields":[{"a":"\u03a6\u0395\u0392\u03a1\u039f\u03a5\u0391\u03a1\u0399\u039f\u03a3 2004"}],"ind1":" ","ind2":" "}}]}
|
id | lib2_1/6666 |
illustrated | Illustrated |
institution | University of West Attica |
isbn | 0-07-057697-1 |
language | English |
physical | x, 454 p. fig., tabl. 24 cm. |
publishDate | 1998 |
publisher | McGraw-Hill |
record_format | marc |
spelling | 20040204d1998 0grey0105 ba eng Semiconductor measurements and instrumentation W.R. Runyan and T.J. Shaffner 2nd ed. New York McGraw-Hill c1998 x, 454 p. fig., tabl. 24 cm. Includes bibliographical references and index Ημιαγωγοί Φυσικές μετρήσεις ΗΛΕΚΤΡΟΝΙΚΗ 621.381 52 Runyan W. R. Shaffner T. J. McGraw-Hill GR ΠΑ.Δ.Α. - Βιβλιοθήκη Πανεπιστημιούπολης 2 AACR2 INST LIBRARY 20040204 621.381 52 RUN 000028736 000028736 BK 0 2 INST LIBRARY 20040204 621.381 52 RUN 000028739 000028739 BK 23 1 |
spellingShingle | Runyan W. R. Shaffner T. J. Semiconductor measurements and instrumentation Ημιαγωγοί Φυσικές μετρήσεις ΗΛΕΚΤΡΟΝΙΚΗ |
title | Semiconductor measurements and instrumentation |
title_auth | Semiconductor measurements and instrumentation |
title_full | Semiconductor measurements and instrumentation W.R. Runyan and T.J. Shaffner |
title_fullStr | Semiconductor measurements and instrumentation W.R. Runyan and T.J. Shaffner |
title_full_unstemmed | Semiconductor measurements and instrumentation W.R. Runyan and T.J. Shaffner |
title_short | Semiconductor measurements and instrumentation |
topic | Ημιαγωγοί Φυσικές μετρήσεις ΗΛΕΚΤΡΟΝΙΚΗ |
topic_facet | Ημιαγωγοί Φυσικές μετρήσεις |