Semiconductor measurements and instrumentation

Λεπτομέρειες βιβλιογραφικής εγγραφής
Κύριοι συγγραφείς: Runyan W. R., Shaffner T. J.
Μορφή: Βιβλίο
Γλώσσα:English
Έκδοση: McGraw-Hill
Έκδοση:2nd ed.

MARC

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Εγγραφή στο Ευρετήριο Αναζήτησης

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author Runyan W. R.
Shaffner T. J.
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Shaffner T. J.
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eng
Semiconductor measurements and instrumentation W.R. Runyan and T.J. Shaffner
2nd ed.
New York McGraw-Hill c1998
x, 454 p. fig., tabl. 24 cm.
Includes bibliographical references and index
Ημιαγωγοί
Φυσικές μετρήσεις
ΗΛΕΚΤΡΟΝΙΚΗ
621.381 52
Runyan W. R.
Shaffner T. J.
McGraw-Hill
GR ΠΑ.Δ.Α. - Βιβλιοθήκη Πανεπιστημιούπολης 2 AACR2
INST LIBRARY 20040204 621.381 52 RUN 000028736 000028736 BK 0 2
INST LIBRARY 20040204 621.381 52 RUN 000028739 000028739 BK 23 1
spellingShingle Runyan W. R.
Shaffner T. J.
Semiconductor measurements and instrumentation
Ημιαγωγοί
Φυσικές μετρήσεις
ΗΛΕΚΤΡΟΝΙΚΗ
title Semiconductor measurements and instrumentation
title_auth Semiconductor measurements and instrumentation
title_full Semiconductor measurements and instrumentation W.R. Runyan and T.J. Shaffner
title_fullStr Semiconductor measurements and instrumentation W.R. Runyan and T.J. Shaffner
title_full_unstemmed Semiconductor measurements and instrumentation W.R. Runyan and T.J. Shaffner
title_short Semiconductor measurements and instrumentation
topic Ημιαγωγοί
Φυσικές μετρήσεις
ΗΛΕΚΤΡΟΝΙΚΗ
topic_facet Ημιαγωγοί
Φυσικές μετρήσεις