Accuracy inspection of NC machine tools by double ball bar method
| Κύριοι συγγραφείς: | , , |
|---|---|
| Άλλοι συγγραφείς: | , |
| Μορφή: | Βιβλίο |
| Γλώσσα: | English |
| Έκδοση: |
Hanser
Hanser/Gardner |
MARC
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| 035 | |l 10005600 | ||
| 100 | |a 19990123d1993 0grey0105 ba | ||
| 101 | 1 | |a eng |b jpn | |
| 200 | 1 | |a Accuracy inspection of NC machine tools by double ball bar method |f Y. Kakino, Y. Ihara, A. Shinohara |g edited by Johannes Heidenhain |g translated by Wolfgang Knapp, Low Seng Chok, Frederik Del Grosso | |
| 210 | |a Munich |a New York |c Hanser |a Cincinnati |c Hanser/Gardner Publications |d c1993 | ||
| 215 | |a x, 190 p. |c diagr. |d 27 cm. | ||
| 300 | |a Includes index | ||
| 320 | |a Bibliography: p. 185-186 | ||
| 606 | 0 | |a Εργαλειομηχανές |x Αριθμητικός έλεγχος | |
| 676 | |a 621.902 3 | ||
| 700 | 1 | |a Kakino |b Yoshiaki |f 1940- | |
| 701 | 1 | |a Ihara |b Y. | |
| 701 | 1 | |a Shinohara |b A. | |
| 702 | 1 | |a Heidenhain |b Johannes | |
| 702 | 1 | |a Knapp |b Wolfgang | |
| 709 | |a Hanser | ||
| 709 | |a Hanser/Gardner | ||
| 801 | 0 | |a GR |b ΠΑ.Δ.Α. - Βιβλιοθήκη Πανεπιστημιούπολης 2 |g AACR2 | |
| 852 | |a INST |b LIBRARY |e 19990217 |h 621.902 3 KAK |p 000017913 |q 000017913 |t BK |y 23 |z 1 | ||
| 901 | |a PART-IV Φ.25 | ||
| 909 | |b 013591 | ||
| 970 | |a ΜΠΑΜΠΑΗ |b ΛΙΤΣΑ |z 1999-02 | ||
Εγγραφή στο Ευρετήριο Αναζήτησης
| _version_ | 1780545243607728128 |
|---|---|
| author | Kakino Yoshiaki 1940- Ihara Y. Shinohara A. |
| author2 | Heidenhain Johannes Knapp Wolfgang |
| author2_role | |
| author2_variant | h j hj k w kw |
| author_facet | Kakino Yoshiaki 1940- Ihara Y. Shinohara A. Heidenhain Johannes Knapp Wolfgang |
| author_role | |
| author_sort | Kakino Yoshiaki 1940- |
| author_variant | k y ky i y iy s a sa |
| building | Campus Library II |
| collection | LIB2 Catalog |
| dewey-full | 621.9023 |
| dewey-hundreds | 600 |
| dewey-ones | 621 |
| dewey-raw | 621.902 3 |
| dewey-search | 621.902 3 |
| dewey-sort | 3621.902 13 |
| dewey-tens | 620 |
| format | Book |
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|
| id | lib2_1/6002 |
| illustrated | Not Illustrated |
| institution | University of West Attica |
| isbn | 1-56990-160-0 3-446-17430-3 |
| language | English |
| physical | x, 190 p. diagr. 27 cm. |
| publishDate | 1993 |
| publisher | Hanser Hanser/Gardner |
| record_format | marc |
| spelling | 19990123d1993 0grey0105 ba eng jpn Accuracy inspection of NC machine tools by double ball bar method Y. Kakino, Y. Ihara, A. Shinohara edited by Johannes Heidenhain translated by Wolfgang Knapp, Low Seng Chok, Frederik Del Grosso Munich New York Hanser Cincinnati Hanser/Gardner Publications c1993 x, 190 p. diagr. 27 cm. Includes index Bibliography: p. 185-186 Εργαλειομηχανές Αριθμητικός έλεγχος 621.902 3 Kakino Yoshiaki 1940- Ihara Y. Shinohara A. Heidenhain Johannes Knapp Wolfgang Hanser Hanser/Gardner GR ΠΑ.Δ.Α. - Βιβλιοθήκη Πανεπιστημιούπολης 2 AACR2 INST LIBRARY 19990217 621.902 3 KAK 000017913 000017913 BK 23 1 |
| spellingShingle | Kakino Yoshiaki 1940- Ihara Y. Shinohara A. Accuracy inspection of NC machine tools by double ball bar method Εργαλειομηχανές Αριθμητικός έλεγχος |
| title | Accuracy inspection of NC machine tools by double ball bar method |
| title_auth | Accuracy inspection of NC machine tools by double ball bar method |
| title_full | Accuracy inspection of NC machine tools by double ball bar method Y. Kakino, Y. Ihara, A. Shinohara edited by Johannes Heidenhain translated by Wolfgang Knapp, Low Seng Chok, Frederik Del Grosso |
| title_fullStr | Accuracy inspection of NC machine tools by double ball bar method Y. Kakino, Y. Ihara, A. Shinohara edited by Johannes Heidenhain translated by Wolfgang Knapp, Low Seng Chok, Frederik Del Grosso |
| title_full_unstemmed | Accuracy inspection of NC machine tools by double ball bar method Y. Kakino, Y. Ihara, A. Shinohara edited by Johannes Heidenhain translated by Wolfgang Knapp, Low Seng Chok, Frederik Del Grosso |
| title_short | Accuracy inspection of NC machine tools by double ball bar method |
| topic | Εργαλειομηχανές Αριθμητικός έλεγχος |
| topic_facet | Εργαλειομηχανές Αριθμητικός έλεγχος |