Semiconductor memories Technology, testing, and reliability
| Κύριος συγγραφέας: | |
|---|---|
| Μορφή: | Βιβλίο |
| Γλώσσα: | English |
| Έκδοση: |
IEEE Press
|
MARC
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| 200 | 1 | |a Semiconductor memories |e Technology, testing, and reliability |f Ashok K. Sharma | |
| 210 | |a New York |c IEEE Press |d c1997 | ||
| 215 | |a xii, 462 p. |c diagr., tabl. |d 26 cm. | ||
| 300 | |a "IEEE Solid-State Circuits Council, sponsor." | ||
| 320 | |a Includes bibliographical references and index | ||
| 606 | 0 | |a Συσκευές μνήμης ημιαγωγών | |
| 606 | 0 | |a Συσκευές αποθήκευσης ημιαγωγών | |
| 606 | 0 | |a Ημιαγωγοί μεταλλικού οξειδίου, Συμπληρωματικοί | |
| 676 | |a 621.397 32 | ||
| 700 | 1 | |a Sharma |b Ashok K. | |
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| 970 | |a ΜΠΑΜΠΑΗ |b ΛΙΤΣΑ |z 1999-02 | ||
Εγγραφή στο Ευρετήριο Αναζήτησης
| _version_ | 1780545243072954370 |
|---|---|
| author | Sharma Ashok K. |
| author_facet | Sharma Ashok K. |
| author_role | |
| author_sort | Sharma Ashok K. |
| author_variant | s a k sak |
| building | Campus Library II |
| collection | LIB2 Catalog |
| dewey-full | 621.39732 |
| dewey-hundreds | 600 |
| dewey-ones | 621 |
| dewey-raw | 621.397 32 |
| dewey-search | 621.397 32 |
| dewey-sort | 3621.397 232 |
| dewey-tens | 620 |
| format | Book |
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|
| id | lib2_1/5601 |
| illustrated | Not Illustrated |
| institution | University of West Attica |
| isbn | 0-7803-1114-0 |
| language | English |
| physical | xii, 462 p. diagr., tabl. 26 cm. |
| publishDate | 1997 |
| publisher | IEEE Press |
| record_format | marc |
| spelling | 19990123d1997 0grey0105 ba eng Semiconductor memories Technology, testing, and reliability Ashok K. Sharma New York IEEE Press c1997 xii, 462 p. diagr., tabl. 26 cm. "IEEE Solid-State Circuits Council, sponsor." Includes bibliographical references and index Συσκευές μνήμης ημιαγωγών Συσκευές αποθήκευσης ημιαγωγών Ημιαγωγοί μεταλλικού οξειδίου, Συμπληρωματικοί 621.397 32 Sharma Ashok K. IEEE Press GR ΠΑ.Δ.Α. - Βιβλιοθήκη Πανεπιστημιούπολης 2 AACR2 INST LIBRARY 19990204 621.397 32 SHA 000017405 000017405 BK 23 1 INST LIBRARY 19990204 621.397 32 SHA 000017406 000017406 BK 0 2 INST LIBRARY 19990204 621.397 32 SHA 000017408 000017408 BK 0 3 |
| spellingShingle | Sharma Ashok K. Semiconductor memories Technology, testing, and reliability Συσκευές μνήμης ημιαγωγών Συσκευές αποθήκευσης ημιαγωγών Ημιαγωγοί μεταλλικού οξειδίου, Συμπληρωματικοί |
| title | Semiconductor memories Technology, testing, and reliability |
| title_auth | Semiconductor memories Technology, testing, and reliability |
| title_full | Semiconductor memories Technology, testing, and reliability Ashok K. Sharma |
| title_fullStr | Semiconductor memories Technology, testing, and reliability Ashok K. Sharma |
| title_full_unstemmed | Semiconductor memories Technology, testing, and reliability Ashok K. Sharma |
| title_short | Semiconductor memories |
| title_sub | Technology, testing, and reliability |
| topic | Συσκευές μνήμης ημιαγωγών Συσκευές αποθήκευσης ημιαγωγών Ημιαγωγοί μεταλλικού οξειδίου, Συμπληρωματικοί |
| topic_facet | Συσκευές μνήμης ημιαγωγών Συσκευές αποθήκευσης ημιαγωγών Ημιαγωγοί μεταλλικού οξειδίου, Συμπληρωματικοί |