Integrated circuit quality and reliability

Λεπτομέρειες βιβλιογραφικής εγγραφής
Κύριος συγγραφέας: Hnatek Eugene R.
Μορφή: Βιβλίο
Γλώσσα:English
Έκδοση: Dekker, M.
Έκδοση:2nd ed., rev. and expanded
Σειρά:Dekker, M.

MARC

LEADER 00000nam a2200000 i 4500
001 1/5324
010 |a 0-8247-9283-1 
035 |l 10011778 
100 |a 20001114d1995 0grey0105 ba 
101 0 |a eng 
200 1 |a Integrated circuit quality and reliability  |f Eugene R. Hnatek 
205 |a 2nd ed., rev. and expanded 
210 |a New York  |c Marcel Dekker  |d c1995 
215 |a xiii, 786 p.  |c fig., ill., tabl.  |d 23 cm. 
225 2 |a Electrical Engineering and Electronics  |v 91 
320 |a Includes bibliographical references and index 
410 1 |t Electrical Engineering and Electronics  |f Dekker, M.  |v 91 
606 0 |a Ολοκληρωμένα κυκλώματα 
676 |a ΗΛΕΚΤΡΟΝΙΚΗ 
676 |a 621.381 5 
700 1 |a Hnatek  |b Eugene R. 
709 |a Dekker, M. 
801 0 |a GR  |b ΠΑ.Δ.Α. - Βιβλιοθήκη Πανεπιστημιούπολης 2  |g AACR2 
852 |a INST  |b LIBRARY  |e 20001211  |h 621.381 5 HNA  |p 000025888  |q 000025888  |t BK  |y 23  |z 1 
901 |a ΦΑΣΗ 11 
909 |b 024385 
960 |a ΣΕΠΤΕΜΒΡΙΟΣ 2000 
970 |a ΜΠΑΡΤΖΩΚΑ  |b ΞΕΝΙΑ  |z 2000-11 

Εγγραφή στο Ευρετήριο Αναζήτησης

_version_ 1780545242983825408
author Hnatek Eugene R.
author_facet Hnatek Eugene R.
author_role
author_sort Hnatek Eugene R.
author_variant h e r her
building Campus Library II
collection LIB2 Catalog
dewey-full 621.3815
dewey-hundreds 600
dewey-ones 621
dewey-raw ΗΛΕΚΤΡΟΝΙΚΗ
621.381 5
dewey-search ΗΛΕΚΤΡΟΝΙΚΗ
621.381 5
dewey-sort 3621.381 15
dewey-tens 620
edition 2nd ed., rev. and expanded
format Book
fullrecord {"leader":"01114nam a2200301 i 4500","fields":[{"001":"1/5324"},{"010":{"subfields":[{"a":"0-8247-9283-1"}],"ind1":" ","ind2":" "}},{"035":{"subfields":[{"l":"10011778"}],"ind1":" ","ind2":" "}},{"100":{"subfields":[{"a":"20001114d1995 0grey0105 ba"}],"ind1":" ","ind2":" "}},{"101":{"subfields":[{"a":"eng"}],"ind1":"0","ind2":" "}},{"200":{"subfields":[{"a":"Integrated circuit quality and reliability"},{"f":"Eugene R. Hnatek"}],"ind1":"1","ind2":" "}},{"205":{"subfields":[{"a":"2nd ed., rev. and expanded"}],"ind1":" ","ind2":" "}},{"210":{"subfields":[{"a":"New York"},{"c":"Marcel Dekker"},{"d":"c1995"}],"ind1":" ","ind2":" "}},{"215":{"subfields":[{"a":"xiii, 786 p."},{"c":"fig., ill., tabl."},{"d":"23 cm."}],"ind1":" ","ind2":" "}},{"225":{"subfields":[{"a":"Electrical Engineering and Electronics"},{"v":"91"}],"ind1":"2","ind2":" "}},{"320":{"subfields":[{"a":"Includes bibliographical references and index"}],"ind1":" ","ind2":" "}},{"410":{"subfields":[{"t":"Electrical Engineering and Electronics"},{"f":"Dekker, M."},{"v":"91"}],"ind1":" ","ind2":"1"}},{"606":{"subfields":[{"a":"\u039f\u03bb\u03bf\u03ba\u03bb\u03b7\u03c1\u03c9\u03bc\u03ad\u03bd\u03b1 \u03ba\u03c5\u03ba\u03bb\u03ce\u03bc\u03b1\u03c4\u03b1"}],"ind1":"0","ind2":" "}},{"676":{"subfields":[{"a":"\u0397\u039b\u0395\u039a\u03a4\u03a1\u039f\u039d\u0399\u039a\u0397"}],"ind1":" ","ind2":" "}},{"676":{"subfields":[{"a":"621.381 5"}],"ind1":" ","ind2":" "}},{"700":{"subfields":[{"a":"Hnatek"},{"b":"Eugene R."}],"ind1":" ","ind2":"1"}},{"709":{"subfields":[{"a":"Dekker, M."}],"ind1":" ","ind2":" "}},{"801":{"subfields":[{"a":"GR"},{"b":"\u03a0\u0391.\u0394.\u0391. - \u0392\u03b9\u03b2\u03bb\u03b9\u03bf\u03b8\u03ae\u03ba\u03b7 \u03a0\u03b1\u03bd\u03b5\u03c0\u03b9\u03c3\u03c4\u03b7\u03bc\u03b9\u03bf\u03cd\u03c0\u03bf\u03bb\u03b7\u03c2 2"},{"g":"AACR2"}],"ind1":" ","ind2":"0"}},{"852":{"subfields":[{"a":"INST"},{"b":"LIBRARY"},{"e":"20001211"},{"h":"621.381 5 HNA"},{"p":"000025888"},{"q":"000025888"},{"t":"BK"},{"y":"23"},{"z":"1"}],"ind1":" ","ind2":" "}},{"901":{"subfields":[{"a":"\u03a6\u0391\u03a3\u0397 11"}],"ind1":" ","ind2":" "}},{"909":{"subfields":[{"b":"024385"}],"ind1":" ","ind2":" "}},{"960":{"subfields":[{"a":"\u03a3\u0395\u03a0\u03a4\u0395\u039c\u0392\u03a1\u0399\u039f\u03a3 2000"}],"ind1":" ","ind2":" "}},{"970":{"subfields":[{"a":"\u039c\u03a0\u0391\u03a1\u03a4\u0396\u03a9\u039a\u0391"},{"b":"\u039e\u0395\u039d\u0399\u0391"},{"z":"2000-11"}],"ind1":" ","ind2":" "}}]}
id lib2_1/5324
illustrated Illustrated
institution University of West Attica
isbn 0-8247-9283-1
language English
physical xiii, 786 p. fig., ill., tabl. 23 cm.
publishDate 1995
publisher Dekker, M.
record_format marc
series Dekker, M.
series2 Electrical Engineering and Electronics
spelling 20001114d1995 0grey0105 ba
eng
Integrated circuit quality and reliability Eugene R. Hnatek
2nd ed., rev. and expanded
New York Marcel Dekker c1995
xiii, 786 p. fig., ill., tabl. 23 cm.
Electrical Engineering and Electronics 91
Includes bibliographical references and index
Electrical Engineering and Electronics Dekker, M. 91
Ολοκληρωμένα κυκλώματα
ΗΛΕΚΤΡΟΝΙΚΗ
621.381 5
Hnatek Eugene R.
Dekker, M.
GR ΠΑ.Δ.Α. - Βιβλιοθήκη Πανεπιστημιούπολης 2 AACR2
INST LIBRARY 20001211 621.381 5 HNA 000025888 000025888 BK 23 1
spellingShingle Hnatek Eugene R.
Integrated circuit quality and reliability
Dekker, M.
Ολοκληρωμένα κυκλώματα
title Integrated circuit quality and reliability
title_auth Integrated circuit quality and reliability
title_full Integrated circuit quality and reliability Eugene R. Hnatek
title_fullStr Integrated circuit quality and reliability Eugene R. Hnatek
title_full_unstemmed Integrated circuit quality and reliability Eugene R. Hnatek
title_short Integrated circuit quality and reliability
topic Ολοκληρωμένα κυκλώματα
topic_facet Ολοκληρωμένα κυκλώματα