Integrated circuit quality and reliability
Κύριος συγγραφέας: | |
---|---|
Μορφή: | Βιβλίο |
Γλώσσα: | English |
Έκδοση: |
Dekker, M.
|
Έκδοση: | 2nd ed., rev. and expanded |
Σειρά: | Dekker, M. |
MARC
LEADER | 00000nam a2200000 i 4500 | ||
---|---|---|---|
001 | 1/5324 | ||
010 | |a 0-8247-9283-1 | ||
035 | |l 10011778 | ||
100 | |a 20001114d1995 0grey0105 ba | ||
101 | 0 | |a eng | |
200 | 1 | |a Integrated circuit quality and reliability |f Eugene R. Hnatek | |
205 | |a 2nd ed., rev. and expanded | ||
210 | |a New York |c Marcel Dekker |d c1995 | ||
215 | |a xiii, 786 p. |c fig., ill., tabl. |d 23 cm. | ||
225 | 2 | |a Electrical Engineering and Electronics |v 91 | |
320 | |a Includes bibliographical references and index | ||
410 | 1 | |t Electrical Engineering and Electronics |f Dekker, M. |v 91 | |
606 | 0 | |a Ολοκληρωμένα κυκλώματα | |
676 | |a ΗΛΕΚΤΡΟΝΙΚΗ | ||
676 | |a 621.381 5 | ||
700 | 1 | |a Hnatek |b Eugene R. | |
709 | |a Dekker, M. | ||
801 | 0 | |a GR |b ΠΑ.Δ.Α. - Βιβλιοθήκη Πανεπιστημιούπολης 2 |g AACR2 | |
852 | |a INST |b LIBRARY |e 20001211 |h 621.381 5 HNA |p 000025888 |q 000025888 |t BK |y 23 |z 1 | ||
901 | |a ΦΑΣΗ 11 | ||
909 | |b 024385 | ||
960 | |a ΣΕΠΤΕΜΒΡΙΟΣ 2000 | ||
970 | |a ΜΠΑΡΤΖΩΚΑ |b ΞΕΝΙΑ |z 2000-11 |
Εγγραφή στο Ευρετήριο Αναζήτησης
_version_ | 1780545242983825408 |
---|---|
author | Hnatek Eugene R. |
author_facet | Hnatek Eugene R. |
author_role | |
author_sort | Hnatek Eugene R. |
author_variant | h e r her |
building | Campus Library II |
collection | LIB2 Catalog |
dewey-full | 621.3815 |
dewey-hundreds | 600 |
dewey-ones | 621 |
dewey-raw | ΗΛΕΚΤΡΟΝΙΚΗ 621.381 5 |
dewey-search | ΗΛΕΚΤΡΟΝΙΚΗ 621.381 5 |
dewey-sort | 3621.381 15 |
dewey-tens | 620 |
edition | 2nd ed., rev. and expanded |
format | Book |
fullrecord | {"leader":"01114nam a2200301 i 4500","fields":[{"001":"1/5324"},{"010":{"subfields":[{"a":"0-8247-9283-1"}],"ind1":" ","ind2":" "}},{"035":{"subfields":[{"l":"10011778"}],"ind1":" ","ind2":" "}},{"100":{"subfields":[{"a":"20001114d1995 0grey0105 ba"}],"ind1":" ","ind2":" "}},{"101":{"subfields":[{"a":"eng"}],"ind1":"0","ind2":" "}},{"200":{"subfields":[{"a":"Integrated circuit quality and reliability"},{"f":"Eugene R. Hnatek"}],"ind1":"1","ind2":" "}},{"205":{"subfields":[{"a":"2nd ed., rev. and expanded"}],"ind1":" ","ind2":" "}},{"210":{"subfields":[{"a":"New York"},{"c":"Marcel Dekker"},{"d":"c1995"}],"ind1":" ","ind2":" "}},{"215":{"subfields":[{"a":"xiii, 786 p."},{"c":"fig., ill., tabl."},{"d":"23 cm."}],"ind1":" ","ind2":" "}},{"225":{"subfields":[{"a":"Electrical Engineering and Electronics"},{"v":"91"}],"ind1":"2","ind2":" "}},{"320":{"subfields":[{"a":"Includes bibliographical references and index"}],"ind1":" ","ind2":" "}},{"410":{"subfields":[{"t":"Electrical Engineering and Electronics"},{"f":"Dekker, M."},{"v":"91"}],"ind1":" ","ind2":"1"}},{"606":{"subfields":[{"a":"\u039f\u03bb\u03bf\u03ba\u03bb\u03b7\u03c1\u03c9\u03bc\u03ad\u03bd\u03b1 \u03ba\u03c5\u03ba\u03bb\u03ce\u03bc\u03b1\u03c4\u03b1"}],"ind1":"0","ind2":" "}},{"676":{"subfields":[{"a":"\u0397\u039b\u0395\u039a\u03a4\u03a1\u039f\u039d\u0399\u039a\u0397"}],"ind1":" ","ind2":" "}},{"676":{"subfields":[{"a":"621.381 5"}],"ind1":" ","ind2":" "}},{"700":{"subfields":[{"a":"Hnatek"},{"b":"Eugene R."}],"ind1":" ","ind2":"1"}},{"709":{"subfields":[{"a":"Dekker, M."}],"ind1":" ","ind2":" "}},{"801":{"subfields":[{"a":"GR"},{"b":"\u03a0\u0391.\u0394.\u0391. - \u0392\u03b9\u03b2\u03bb\u03b9\u03bf\u03b8\u03ae\u03ba\u03b7 \u03a0\u03b1\u03bd\u03b5\u03c0\u03b9\u03c3\u03c4\u03b7\u03bc\u03b9\u03bf\u03cd\u03c0\u03bf\u03bb\u03b7\u03c2 2"},{"g":"AACR2"}],"ind1":" ","ind2":"0"}},{"852":{"subfields":[{"a":"INST"},{"b":"LIBRARY"},{"e":"20001211"},{"h":"621.381 5 HNA"},{"p":"000025888"},{"q":"000025888"},{"t":"BK"},{"y":"23"},{"z":"1"}],"ind1":" ","ind2":" "}},{"901":{"subfields":[{"a":"\u03a6\u0391\u03a3\u0397 11"}],"ind1":" ","ind2":" "}},{"909":{"subfields":[{"b":"024385"}],"ind1":" ","ind2":" "}},{"960":{"subfields":[{"a":"\u03a3\u0395\u03a0\u03a4\u0395\u039c\u0392\u03a1\u0399\u039f\u03a3 2000"}],"ind1":" ","ind2":" "}},{"970":{"subfields":[{"a":"\u039c\u03a0\u0391\u03a1\u03a4\u0396\u03a9\u039a\u0391"},{"b":"\u039e\u0395\u039d\u0399\u0391"},{"z":"2000-11"}],"ind1":" ","ind2":" "}}]}
|
id | lib2_1/5324 |
illustrated | Illustrated |
institution | University of West Attica |
isbn | 0-8247-9283-1 |
language | English |
physical | xiii, 786 p. fig., ill., tabl. 23 cm. |
publishDate | 1995 |
publisher | Dekker, M. |
record_format | marc |
series | Dekker, M. |
series2 | Electrical Engineering and Electronics |
spelling | 20001114d1995 0grey0105 ba eng Integrated circuit quality and reliability Eugene R. Hnatek 2nd ed., rev. and expanded New York Marcel Dekker c1995 xiii, 786 p. fig., ill., tabl. 23 cm. Electrical Engineering and Electronics 91 Includes bibliographical references and index Electrical Engineering and Electronics Dekker, M. 91 Ολοκληρωμένα κυκλώματα ΗΛΕΚΤΡΟΝΙΚΗ 621.381 5 Hnatek Eugene R. Dekker, M. GR ΠΑ.Δ.Α. - Βιβλιοθήκη Πανεπιστημιούπολης 2 AACR2 INST LIBRARY 20001211 621.381 5 HNA 000025888 000025888 BK 23 1 |
spellingShingle | Hnatek Eugene R. Integrated circuit quality and reliability Dekker, M. Ολοκληρωμένα κυκλώματα |
title | Integrated circuit quality and reliability |
title_auth | Integrated circuit quality and reliability |
title_full | Integrated circuit quality and reliability Eugene R. Hnatek |
title_fullStr | Integrated circuit quality and reliability Eugene R. Hnatek |
title_full_unstemmed | Integrated circuit quality and reliability Eugene R. Hnatek |
title_short | Integrated circuit quality and reliability |
topic | Ολοκληρωμένα κυκλώματα |
topic_facet | Ολοκληρωμένα κυκλώματα |