Applied logistic regression

Bibliographic Details
Main Authors: Hosmer David W. (Author), Lemeshow Stanley (Author)
Format: Book
Language:English
Published: Wiley, J.
Edition:2nd ed.
Series:Wiley Series in Probability and Statistics. Texts and References Section
Description
Physical Description:xii, 375 p. fig., tabl. 24 cm.
ISBN:0-471-35632-8